ELECTRODELESS MEASUREMENT OF RESISTIVITIES OVER A VERY WIDE RANGE

被引:9
作者
HAISTY, RW
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D O I
10.1063/1.1771371
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
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页码:262 / &
相关论文
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[1]   CONTACTLESS RESISTIVITY METER FOR SEMICONDUCTORS [J].
BRICE, JC ;
MOORE, P .
JOURNAL OF SCIENTIFIC INSTRUMENTS, 1961, 38 (07) :307-&
[2]   CONTACTLESS METHOD FOR THE ESTIMATION OF RESISTIVITY AND LIFETIME OF SEMICONDUCTORS [J].
HENISCH, HK ;
ZUCKER, J .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1956, 27 (06) :409-410
[3]  
MORDIKE BL, 1963, Z METALLKD, V54, P278
[4]  
ROLL A, 1956, Z METALLKD, V47, P707
[5]   ELECTRODELESS DETERMINATION OF ELECTRICAL CONDUCTIVITIES OF MELTS AT ELEVATED TEMPERATURES [J].
YOSIM, SJ ;
GRANTHAM, LF ;
LUCHSINGER, EB ;
WIKE, R .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1963, 34 (09) :994-&
[6]   MEASUREMENT OF ELECTRICAL RESISTIVITY OF BULK METALS [J].
ZIMMERMAN, J .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1961, 32 (04) :402-&