Improved total inelastic scattering cross section for the rare gases

被引：7

作者：

Bonbam, R. A. ^{[1
,2
]}

Ng, E. W. ^{[1
]}

机构：

[1] Indiana Univ, Dept Chem, Bloomington, IN 47401 USA

[2] Univ Tokyo, Fac Engn & Sci, Dept Chem, Tokyo, Japan

来源：

CHEMICAL PHYSICS LETTERS | 1970年 / 6卷 / 05期

关键词：

D O I：

10.1016/0009-2614(70)85176-4

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

New calculations for the total inelastic electron scattering cross sections for the elements H. He, Ne, Ar and Kr at incident electron energies of 500 eV and 40 keV are presented. The calculations ace given for both an old and a new formula for the total inelastic scattering cross section and are compared where possible with the results of more rigorous calculations. The new results predict that the total inelastic scattering cross sections will be lower for the heavier elements by a factor of 2-4 than previously reported. In addition the value of the cross section for Ne in the low energy region is found to be surprisingly small.

引用

页码：403 / 406

页数：4

共 9 条

[1] Abramowitz M, 1964, NATL BUREAU STANDARD, V55
[2] On the calculation of total electron inelastic scattering cross sections for neutral atoms in the keV energy range
Bonham, R. A.
Ng, E. W.
[J]. CHEMICAL PHYSICS LETTERS, 1969, 4 (06) : 355 - 357
[3] THE STOPPING POWERS OF ATOMS
DALGARNO, A
[J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1960, 76 (489): : 422 - 424
[4] THE REFRACTIVE INDICES AND VERDET CONSTANTS OF THE INERT GASES
DALGARNO, A
KINGSTON, AE
[J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1960, 259 (1298): : 424 - 429
[5] SPECTRAL DISTRIBUTION OF ATOMIC OSCILLATOR STRENGTHS
FANO, U
COOPER, JW
[J]. REVIEWS OF MODERN PHYSICS, 1968, 40 (03) : 441 - +
[6] TOTAL CROSS SECTIONS FOR INELASTIC SCATTERING OF CHARGED PARTICLES BY ATOMS AND MOLECULES .I. A SUM RULE FOR BETHE CROSS SECTIONS AND ITS APPLICATION TO HELIUM ATOM
INOKUTI, M
KIM, YK
PLATZMAN, RL
[J]. PHYSICAL REVIEW, 1967, 164 (01): : 55 - &
[7] KIM Y, 1967, 5 INT C PHYS EL AT C
[8] Determination of object thickness in electron microscopy
Marton, L
Schiff, LI
[J]. JOURNAL OF APPLIED PHYSICS, 1941, 12 (10) : 759 - 765
[9] MCDANIEL EW, 1969, CASE STUDIES ATOMIC, V1, P387

← 1 →