CONTRAST IN THE ELECTRON SPECTROSCOPIC IMAGING MODE OF A TEM .2. Z-RATIO, STRUCTURE-SENSITIVE AND PHASE-CONTRAST

被引:39
作者
REIMER, L
ROSSMESSEMER, M
机构
[1] Physikalisches Institut, Universität Münster, Münster, D-4400
来源
JOURNAL OF MICROSCOPY-OXFORD | 1990年 / 159卷
关键词
electron spectroscopic; imaging; inelastic‐to‐elastic total cross‐section; phase contrast; structure‐sensitive contrast below the carbon K edge; Z‐ratio contrast;
D O I
10.1111/j.1365-2818.1990.tb04772.x
中图分类号
TH742 [显微镜];
学科分类号
摘要
The ratio of inelastic‐to‐elastic total cross‐sections has been measured in an energy‐filtering electron microscope for different elements. Formulae for the transmission of elastically and inelastically scattered electrons in part I were used to calculate the optimum conditions for a Z‐ratio contrast in the electron spectroscopic imaging mode. Structure‐sensitive contrast can be observed for all non‐carbon atoms in biological sections when filtering with an energy loss at ΔE ∼ 250 eV below the carbon K edge. Model experiments with evaporated layers of different elements on a carbon film allow measurement of the contrast increase. Filtering with the carbon plasmon loss shows a lower phase contrast than with zero‐loss filtering. This can be explained by calculating contrast transfer functions for inelastically scattered electrons. 1990 Blackwell Science Ltd
引用
收藏
页码:143 / 160
页数:18
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