VIBRATION MEASUREMENT USING PHASE-SHIFTING STROBOSCOPIC HOLOGRAPHIC-INTERFEROMETRY

被引：29

作者：

NAKADATE, S

SAITO, H

NAKAJIMA, T

机构：

来源：

OPTICA ACTA | 1986年 / 33卷 / 10期

关键词：

D O I：

10.1080/713821870

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：1295 / 1309

页数：15

共 21 条

[1]

ALEKSOFF CC, 1974, HOLOGRAPHIC NONDESTR, P247

[2] OBSERVATION OF SURFACE VIBRATION MODES BY STROBOSCOPIC HOLOGRAM INTERFEROMETRY [J].

ARCHBOLD, E ;

ENNOS, AE .

NATURE, 1968, 217 (5132) :942-&

[3]

Bruning J.H., 1978, OPTICAL SHOP TESTING, P409

[4]

Dandliker R., 1980, PROGR OPTICS, V17, P1

[5] <bold>Statistical Model Order Reduction for Interconnect Circuits Considering Spatial Correlations</bold> [J].

Fan, Jeffrey ;

Mi, Ning ;

Tan, Sheldon X. -D. ;

Cai, Yici ;

Hong, Xianlong .

2007 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, VOLS 1-3, 2007, :1508-+

[6] REAL-TIME HOLOGRAPHIC-INTERFEROMETRY - A MICROCOMPUTER SYSTEM FOR THE MEASUREMENT OF VECTOR DISPLACEMENTS [J].

HARIHARAN, P ;

OREB, BF ;

BROWN, N .

APPLIED OPTICS, 1983, 22 (06) :876-880

[7] VIBRATION PHASE MEASUREMENT BY ROTATION-STROBE HOLOGRAPHY [J].

MAYER, GM .

JOURNAL OF APPLIED PHYSICS, 1969, 40 (07) :2863-&

[8] HYBRID HOLOGRAPHIC INTERFEROMETER FOR MEASURING 3-DIMENSIONAL DEFORMATIONS [J].

NAKADATE, S ;

MAGOME, N ;

HONDA, T ;

TSUJIUCHI, J .

OPTICAL ENGINEERING, 1981, 20 (02) :246-252

[9] FRINGE SCANNING SPECKLE-PATTERN INTERFEROMETRY [J].

NAKADATE, S ;

SAITO, H .

APPLIED OPTICS, 1985, 24 (14) :2172-2180

[10]

NAKADATE S, 1986, UNPUB APPL OPTICS

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