TE AND CD NMR-STUDY OF LOCAL-STRUCTURE AND BONDING IN CD1-XZNXTE

[1] CHEN AB, 1985, PHYS REV B, V32, P3685

[2] HASS KC, 1986, UNPUB 18TH INT P INT

[3] CALCULATION OF CHEMICAL SHIFTS .I. GENERAL FORMULATION + Z DEPENDENCE [J]. JOURNAL OF CHEMICAL PHYSICS, 1964, 40 (06) : 1714 - +

[4] BOND LENGTHS AROUND ISOVALENT IMPURITIES AND IN SEMICONDUCTOR SOLID-SOLUTIONS [J]. PHYSICAL REVIEW B, 1984, 30 (10): : 6217 - 6220

[5] MEYER JMM, UNPUB

[6] MIKKELSON SA, 1983, PHYS REV B, V29, P7130

[7] EXAFS OF CD1-XZNXTE - A TEST OF THE RANDOM DISTRIBUTION IN ZINCBLENDE TERNARY ALLOYS [J]. SOLID STATE COMMUNICATIONS, 1985, 53 (06) : 509 - 512

[8] CORRELATION OF SI-O-SI OR SI-O-AL ANGLES AND SI-29 NMR CHEMICAL-SHIFTS IN SILICATES AND ALUMINOSILICATES - INTERPRETATION BY SEMI-EMPIRICAL QUANTUM-CHEMICAL CONSIDERATIONS [J]. CHEMICAL PHYSICS LETTERS, 1985, 114 (01) : 28 - 30

[9] RAMADAS S, 1984, NATURE, V308, P521

[10] CORRELATIONS IN PSEUDOBINARY ALLOYS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (04): : 1965 - 1970

[1] CHEN AB, 1985, PHYS REV B, V32, P3685

[2] HASS KC, 1986, UNPUB 18TH INT P INT

[3] CALCULATION OF CHEMICAL SHIFTS .I. GENERAL FORMULATION + Z DEPENDENCE [J]. JOURNAL OF CHEMICAL PHYSICS, 1964, 40 (06) : 1714 - +

[4] BOND LENGTHS AROUND ISOVALENT IMPURITIES AND IN SEMICONDUCTOR SOLID-SOLUTIONS [J]. PHYSICAL REVIEW B, 1984, 30 (10): : 6217 - 6220

[5] MEYER JMM, UNPUB

[6] MIKKELSON SA, 1983, PHYS REV B, V29, P7130

[7] EXAFS OF CD1-XZNXTE - A TEST OF THE RANDOM DISTRIBUTION IN ZINCBLENDE TERNARY ALLOYS [J]. SOLID STATE COMMUNICATIONS, 1985, 53 (06) : 509 - 512

[8] CORRELATION OF SI-O-SI OR SI-O-AL ANGLES AND SI-29 NMR CHEMICAL-SHIFTS IN SILICATES AND ALUMINOSILICATES - INTERPRETATION BY SEMI-EMPIRICAL QUANTUM-CHEMICAL CONSIDERATIONS [J]. CHEMICAL PHYSICS LETTERS, 1985, 114 (01) : 28 - 30

[9] RAMADAS S, 1984, NATURE, V308, P521

[10] CORRELATIONS IN PSEUDOBINARY ALLOYS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (04): : 1965 - 1970