CHARACTERIZATION OF DEFECTS DUE TO LOW-VOLTAGE THIN-FILM SPUTTER DEPOSITION BY MEANS OF THE MIS JUNCTION

被引：1

作者：

KEPPNER, H

MUNZ, P

MAIER, C

BUCHER, E

机构：

来源：

关键词：

D O I：

10.1016/0042-207X(86)90137-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：905 / 907

页数：3

相关论文

共 8 条

[1]

Cheek G., 1981, Fifteenth IEEE Photovoltaic Specialists Conference - 1981, P660

[2]

Grove A S, 1967, PHYS TECHNOLOGY SEMI

[3]

HIDEKAZU Y, 1982, J APPL PHYS S21, V21, P53

[4]

MUNZ P, 1982, RARE EARTHS MODERN S, V3, P547

[5]

MUNZ P, 1984, 17TH IEEE PHOT SPEC, P1263

[6] MIS SOLAR-CELLS - REVIEW [J].

PULFREY, DL .

[7]

SING R, 1981, SOLAR CELLS, V3, P96

[8]

1965, ELECTROCHEM TECHNOL, V3, P75