OPTICAL PROPERTIES OF THIN FILMS OF NI, CU, AND NI+60 PERCENT CU IN WAVELENGTH RANGE 3000-6000-A

The optical absorption coefficients are measured for thin films of Ni, Cu, and Ni+60% Cu in the wavelength range 3000-6000 Å. Local areas are examined by transmission electron microscopy using both bright and dark-field techniques in order to characterize the residual film structure, in addition to measuring the mean film thickness over the optically irradiated zone from twin-fault boundary projections. The variation of absorption coefficients in the series Ni, Cu, Ni+60% Cu, particularly approaching the infrared, appear to indicate a variation with stacking-fault energy. These results suggest the characterization of relative stacking-fault free energy in transition and transition non-transition metal alloys. © 1969.