Z-SCAN MEASUREMENTS OF THE ANISOTROPY OF NONLINEAR REFRACTION AND ABSORPTION IN CRYSTALS

被引:164
作者
DESALVO, R
SHEIKBAHAE, M
SAID, AA
HAGAN, DJ
VANSTRYLAND, EW
机构
[1] Center for Research in Electro-Optics and Lasers, University of Central Florida, Orlando, FL
[2] Department of Physics and Electrical Engineering, University of Central Florida
关键词
D O I
10.1364/OL.18.000194
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We introduce a method for measuring the anisotropy of nonlinear absorption and nonlinear refraction in crystals by incorporating a wave plate into the Z-scan apparatus. We demonstrate this method by measuring the polarization dependence of the nonlinear refractive index or two-photon absorption coefficient in BaF2, KTP, and GaAs at wavelengths of 532 and 1064 nm.
引用
收藏
页码:194 / 196
页数:3
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