CRLVV AUGER EMISSION AND PHOTOREDUCTION OF HEXAVALENT CR OXIDES

被引：23

作者：

SCHROTT, AG ^{[1
]}

FRANKEL, GS ^{[1
]}

DAVENPORT, AJ ^{[1
]}

ISAACS, HS ^{[1
]}

JAHNES, CV ^{[1
]}

RUSSAK, MA ^{[1
]}

机构：

[1] BROOKHAVEN NATL LAB,DEPT APPL SCI,UPTON,NY 11973

来源：

SURFACE SCIENCE | 1991年 / 250卷 / 1-3期

关键词：

D O I：

10.1016/0039-6028(91)90716-6

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The CrLVV Auger emission has been used to investigate the local chemical environment of Cr(VI) in connection with the photoreduction produced by a non-monochromatic X-ray source. We compared Cr(VI) in oxides on anodized Al exposed to a chromate solution, with Cr(VI) in oxides on Al/Cr alloys polarized in a borate solution. The former were found to be much more sensitive to photoreduction than the latter. This is correlated with the intensity of the CrLVV Auger emission, attributed to a charge transfer transition in the final state of the photoemission process.

引用

页码：139 / 146

页数：8

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