RECENT DEVELOPMENTS IN X-RAY AND NEUTRON SMALL-ANGLE SCATTERING INSTRUMENTATION AND DATA-ANALYSIS

被引：56

作者：

SCHELTEN, J ^{[1
]}

HENDRICKS, RW ^{[1
]}

机构：

[1] OAK RIDGE NATL LAB,DIV MET & CERAM,OAK RIDGE,TN 37830

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1978年 / 11卷 / OCT期

关键词：

D O I：

10.1107/S0021889878013461

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：297 / 324

页数：28

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