共 13 条
[2]
ANOMALOUS DISPERSION CORRECTION DELTAF' FOR NICKEL CLOSE TO K-ABSORPTION EDGE
[J].
ZEITSCHRIFT FUR PHYSIK,
1972, 253 (03)
:232-&
[4]
Differences in the Intensity of X-Ray Reflection from the two 111-surfaces of Sphalerite
[J].
ZEITSCHRIFT FUR PHYSIK,
1930, 63 (5-6)
:345-369
[5]
ESCAPE PEAKS CAUSED BY A GE(LI) DETECTOR IN AN ENERGY-DISPERSIVE DIFFRACTOMETER
[J].
JOURNAL OF APPLIED CRYSTALLOGRAPHY,
1973, 6 (AUG1)
:297-298
[6]
PRECISION OF INTERPLANAR DISTANCES MEASURED BY AN ENERGY-DISPERSIVE DIFFRACTOMETER
[J].
JOURNAL OF APPLIED CRYSTALLOGRAPHY,
1973, 6 (APR1)
:117-122
[7]
FUKAMACHI T, 1971, TECH REP I SOLID S B
[8]
GEIB IG, 1932, PHYS REV, V42, P908
[10]
DETERMINATION OF ABSOLUTE CONFIGURATION BY LAUE PHOTOGRAPHS
[J].
NATURE,
1954, 173 (4415)
:1145-1146