The problem of surface-wave reflection at thin-strip overlays occurs frequently in signal-processing devices. Grooved array reflectors employ strip overlays of the same material as the substrate, while metallic transducers incorporate strips of a material different from the substrate. A simple model for calculating the reflection coefficient of thin overlays is described, based on the normal-mode analysis developed by Auld. Calculated values are in close agreement with reported experimental values for grooves in ST-X quartz and Y-Z lithium niobate, and for aluminum on ST-X quartz.