NEAR L-EDGE (4.7-5.5 KEV) PHOTOIONIZATION IN XENON

被引：9

作者：

DEZARNAUD, C ^{[1
]}

GUILLOT, F ^{[1
]}

TRONC, M ^{[1
]}

机构：

[1] UNIV PARIS 11, MEN, CEA, CNRS, LURE LAB, F-91405 ORSAY, FRANCE

来源：

JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS | 1992年 / 25卷 / 05期

关键词：

D O I：

10.1088/0953-4075/25/5/001

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The total ion yield has been measured in the vicinity of L edges (4.7-5.5 keV) in xenon with synchrotron radiation. White lines are observed near the 2p3/2(-1) and 2p1/2(-1) ionization thresholds, corresponding to excitation of 2p electrons into unfilled nd (n greater-than-or-equal-to 5) levels. Low intensity and broad structures observed in both the L3 and L2 continua are attributed to double core-valence (2p + 5p) excitations.

引用

页码：L123 / L126

页数：4

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