MULTIPLE ENTRANCE SLIT VIDICON SPECTROMETER FOR SIMULTANEOUS MULTIELEMENT ANALYSIS

被引:19
作者
BUSCH, KW [1 ]
MALLOY, B [1 ]
TALMI, Y [1 ]
机构
[1] PRINCETON APPL RES CORP, PRINCETON, NJ 08540 USA
关键词
D O I
10.1021/ac50042a020
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
A vidicon spectrometer employing multiple entrance slits to simultaneously focus several 40-nm windows on the SIT detector Is described. The system may be visualized as the reverse of a direct reader, since multiple entrance slits and a single multichannel detector are used Instead of a single entrance slit and multiple detectors. Detection limits obtained with the system for Mn, Cr, Sr, Ba, Li and K by atomic emission with a nitrous oxide-acetylene flame are reported. The advantages of this system for simultaneous multielement analysis are discussed. © 1979, American Chemical Society. All rights reserved.
引用
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页码:670 / 673
页数:4
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