THE EFFECT OF HEAT-TREATMENT ON THE PITTING BEHAVIOR OF SICW AA2124

被引:49
作者
MCINTYRE, JF [1 ]
CONRAD, RK [1 ]
GOLLEDGE, SL [1 ]
机构
[1] USN,CTR SURFACE WARFARE,ELECTROCHEM BRANCH,SILVER SPRING,MD 20903
关键词
D O I
10.5006/1.3580856
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The formation of large intermetallics near SiC and potential microsegregation of Mg to this region (resulting in a depletion of Mg in solid solution in adjacent grains) makes the areas adjacent to SiC whiskers more reactive. Because of this increase in reactivity, localized attack near the reinforcement should predominate. The high reactivity of the interface makes it likely that intermetallics will form in the vicinity of SiC whiskers during aging at elevated temperatures and lead to preferential corrosion at the interface. Although preliminary evidence suggests that pits nucleate near SiC whiskers because of the presence of Cu intermetallics, the severity of attack is no worse than observed for the unreinforced alloy.
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页码:902 / 905
页数:4
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