POLARIZATION-SENSITIVE LOW-COHERENCE REFLECTOMETER FOR BIREFRINGENCE CHARACTERIZATION AND RANGING

被引:563
作者
HEE, MR
HUANG, D
SWANSON, EA
FUJIMOTO, JG
机构
[1] MIT,ELECTR RES LAB,CAMBRIDGE,MA 02139
[2] MIT,LINCOLN LAB,LEXINGTON,MA 02173
关键词
D O I
10.1364/JOSAB.9.000903
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We present a polarization-sensitive optical coherence-domain reflectometer capable of characterizing the phase retardation between orthogonal linear polarization modes at each reflection point in a birefringent sample. The device is insensitive to the rotation of the sample in the plane perpendicular to ranging. Phase measurement accuracy is +/-0.86-degrees, but the reflectometer can distinguish local variations in birefringence as small as 0.05-degrees with a distance resolution of 10.8-mu-m and a dynamic range of 90 dB. Birefringence-sensitive ranging in a wave plate, an electro-optic modulator, and a calf coronary artery is demonstrated.
引用
收藏
页码:903 / 908
页数:6
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