SURFACE GEOMETRY DETERMINATION BY LARGE-ANGLE ION-SCATTERING

被引：110

作者：

FAUSTER, T

机构：

[1] EURATOM Assoc, Garching, West ger, EURATOM Assoc, Garching, West ger

来源：

VACUUM | 1988年 / 38卷 / 02期

关键词：

D O I：

10.1016/0042-207X(88)90611-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

138

引用

页码：129 / 142

页数：14

共 136 条

[1] OSCILLATORY RELAXATION OF THE CU(110) SURFACE
ADAMS, DL
NIELSEN, HB
ANDERSEN, JN
[J]. SURFACE SCIENCE, 1983, 128 (2-3) : 294 - 310
[2] THE STRUCTURE OF A STEPPED COPPER (410) SURFACE DETERMINED BY ION-SCATTERING SPECTROSCOPY
ALGRA, AJ
LUITJENS, SB
SUURMEIJER, EPTM
BOERS, AL
[J]. SURFACE SCIENCE, 1980, 100 (02) : 329 - 341
[3] STRUCTURE-ANALYSIS OF THE SI(111)7X7 SURFACE BY LOW-ENERGY ION-SCATTERING
AONO, M
SOUDA, R
OSHIMA, C
ISHIZAWA, Y
[J]. PHYSICAL REVIEW LETTERS, 1983, 51 (09) : 801 - 804
[4] DIRECT ANALYSIS OF THE STRUCTURE, CONCENTRATION, AND CHEMICAL ACTIVITY OF SURFACE ATOMIC VACANCIES BY SPECIALIZED LOW-ENERGY ION-SCATTERING SPECTROSCOPY - TIC (001)
AONO, M
HOU, Y
SOUDA, R
OSHIMA, C
OTANI, S
ISHIZAWA, Y
[J]. PHYSICAL REVIEW LETTERS, 1983, 50 (17) : 1293 - 1296
[5] STRUCTURE-ANALYSIS OF AG OVERLAYERS ON SI(111) BY LOW-ENERGY LI+ ION-SCATTERING
AONO, M
SOUDA, R
OSHIMA, C
ISHIZAWA, Y
[J]. SURFACE SCIENCE, 1986, 168 (1-3) : 713 - 723
[6] QUANTITATIVE SURFACE-STRUCTURE ANALYSIS BY LOW-ENERGY ION-SCATTERING
AONO, M
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 2 (1-3) : 374 - 383
[7] QUANTITATIVE SURFACE ATOMIC GEOMETRY AND TWO-DIMENSIONAL SURFACE ELECTRON-DISTRIBUTION ANALYSIS BY A NEW TECHNIQUE IN LOW-ENERGY ION-SCATTERING
AONO, M
OSHIMA, C
ZAIMA, S
OTANI, S
ISHIZAWA, Y
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1981, 20 (11) : L829 - L832
[8] LOW-ENERGY ION-SCATTERING FROM THE SI(111) SURFACE - ANALYSIS OF THE CLEAN 7 X 7 AND TE-STABILIZED 1 X 1 STRUCTURES
AONO, M
SOUDA, R
OSHIMA, C
ISHIZAWA, Y
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3): : 241 - 247
[9] INTERACTION POTENTIAL BETWEEN HE+ AND TI IN A KEV RANGE AS REVEALED BY A SPECIALIZED TECHNIQUE IN ION-SCATTERING SPECTROSCOPY
AONO, M
HOU, Y
SOUDA, R
OSHIMA, C
OTANI, S
ISHIZAWA, Y
MATSUDA, K
SHIMIZU, R
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1982, 21 (11): : L670 - L672
[10] LOW-ENERGY ION-SCATTERING FROM THE SI(001) SURFACE
AONO, M
HOU, Y
OSHIMA, C
ISHIZAWA, Y
[J]. PHYSICAL REVIEW LETTERS, 1982, 49 (08) : 567 - 570

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