DYNAMIC IDD TEST CIRCUIT FOR MIXED-SIGNAL ICS

被引：18

作者：

ARGUELLES, J

MARTINEZ, M

BRACHO, S

机构：

[1] University of Cantabria, Electronics Department, Avda. de los Castros s/n

来源：

ELECTRONICS LETTERS | 1994年 / 30卷 / 06期

关键词：

MIXED ANALOG-DIGITAL ICS; TESTING; INTEGRATED CIRCUIT TESTING; BUILT-IN SELF TEST;

D O I：

10.1049/el:19940343

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Built-in test circuitry is proposed that uses the dynamic supply current consumption of a mixed signal circuit under test for a unified fault detection method. Simulation waveform are reported to illustrate the performance of the proposed circuitry.

引用

页码：485 / 486

页数：2