RAPID SCANNING WITH FABRY-PEROT ETALON

[1] BALLIK EA, 1966, APPL OPTICS, V5, P170, DOI 10.1364/AO.5.0170_1

[2] REFLECTANCE AND TRANSMITTANCE OF EVAPORATED ALUMINUM AND ALUMINUM - MAGNESIUM FLUORIDE FILMS IN ULTRAVIOLET (]1800 A) [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1967, 57 (04) : 481 - &

[3] Bayer-Helms F., 1963, Z ANGEW PHYS, V15, P330

[4] BORN M, 1964, PRINCIPLES OPTICS, P323

[5] PARALLEL MOVEMENT FOR HIGH FINESSE INTERFEROMETRIC SCANNING [J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1962, 39 (02): : 41 - &

[6] BRADLEY DJ, 1966, J PHYS S

[7] BRON M, 1964, PRINCIPLES OPTICS, P346

[8] CHABBAL R, 1958, REV OPT, V37, P49

[9] CHABBAL R, 1953, J RECH CNRS, V24, P138

[10] RAPID SCANNING OF SPECTRAL LINE PROFILES USING AN OSCILLATING FABRY-PEROT INTERFEROMETER [J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1963, 40 (09): : 433 - &

[1] BALLIK EA, 1966, APPL OPTICS, V5, P170, DOI 10.1364/AO.5.0170_1

[2] REFLECTANCE AND TRANSMITTANCE OF EVAPORATED ALUMINUM AND ALUMINUM - MAGNESIUM FLUORIDE FILMS IN ULTRAVIOLET (]1800 A) [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1967, 57 (04) : 481 - &

[3] Bayer-Helms F., 1963, Z ANGEW PHYS, V15, P330

[4] BORN M, 1964, PRINCIPLES OPTICS, P323

[5] PARALLEL MOVEMENT FOR HIGH FINESSE INTERFEROMETRIC SCANNING [J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1962, 39 (02): : 41 - &

[6] BRADLEY DJ, 1966, J PHYS S

[7] BRON M, 1964, PRINCIPLES OPTICS, P346

[8] CHABBAL R, 1958, REV OPT, V37, P49

[9] CHABBAL R, 1953, J RECH CNRS, V24, P138

[10] RAPID SCANNING OF SPECTRAL LINE PROFILES USING AN OSCILLATING FABRY-PEROT INTERFEROMETER [J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1963, 40 (09): : 433 - &