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INTERPRETATION OF WIDTHS OF SEM ELECTRON CHANNELLING LINES

被引：14
作者：
SCHULSON, EM
机构：
来源：
PHYSICA STATUS SOLIDI B-BASIC RESEARCH | 1971年 / 46卷 / 01期
关键词：
D O I：
10.1002/pssb.2220460108
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
引用
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页码：95 / &
相关论文
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[7]   OPTIMUM CONDITIONS FOR GENERATING CHANNELLING PATTERNS IN SCANNING ELECTRON MICROSCOPE [J].
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