HOT-ELECTRON MICROCALORIMETERS AS HIGH-RESOLUTION X-RAY-DETECTORS

被引：63

作者：

NAHUM, M ^{[1
]}

MARTINIS, JM ^{[1
]}

机构：

[1] NATL INST STAND & TECHNOL,BOULDER,CO 80303

来源：

APPLIED PHYSICS LETTERS | 1995年 / 66卷 / 23期

关键词：

D O I：

10.1063/1.113723

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Measurements are presented on a novel microcalorimeter for the detection of x rays. This detector uses a normal metal film deposited on a thin membrane to absorb x-ray photons. The subsequent temperature rise of the electrons is measured from the current-voltage characteristics of a normal-insulator- superconductor tunnel junction, where part of the absorber forms the normal electrode. A superconducting-quantum-interference-device is used as a low-noise high-bandwidth readout for the junction. We have measured an energy resolution of 22 eV full width at half-maximum and a time constant of 15 μs for a detector operating at 80 mK and having a 0.5 μm thick Au absorber with an area of 100×100 μm2.© 1995 American Institute of Physics.

引用

页码：3203 / 3205

页数：3

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