CALIBRATION OF THE RADIOISOTOPE-EXCITED X-RAY SPECTROMETER WITH THICK STANDARDS

被引：8

作者：

YAP, CT

KUMP, P

TANG, SM

WIJESINGHE, L

机构：

来源：

APPLIED SPECTROSCOPY | 1987年 / 41卷 / 01期

关键词：

D O I：

10.1366/0003702874868142

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：80 / 84

页数：5

共 12 条

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[2]

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CRISS, JW .

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[7]

Storm E., 1970, ATOM DATA NUCL DATA, V7, P565, DOI DOI 10.1016/S0092-640X(70)80017-1

[8] AN XRF METHOD FOR THE DETERMINATION OF THE EFFICIENCY OF SI(LI) DETECTORS IN AN EXTENDED-SOURCE GEOMETRY BY USING THICK SPECIMENS [J].

TANG, SM ;

KUMP, P ;

YAP, CT ;

BILAL, MG .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1985, 241 (2-3) :503-506

[9]

TANG SM, 1986, XRAY SPECTROMETRY, V15

[10]

VANESPEN P, 1979, MICROBEAM ANAL

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