THERMODYNAMIC MODELING OF THE LOCAL ATOMIC ORDER IN AMORPHOUS-ALLOYS BASED ON SILICON AND GERMANIUM

被引:3
作者
EFSTATHIADIS, H
SMITH, FW
机构
[1] Department of Physics, The City College, City University of New York, New York, NY
来源
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1994年 / 70卷 / 03期
关键词
D O I
10.1080/01418639408240229
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The free-energy model (FEM) previously developed for the prediction of the bonding in amorphous covalent alloys is applied here to amorphous alloys based on Si and Ge. Predictions of the FEM are presented which indicate that H is preferentially bonded to Si and that dangling bonds appear preferentially on Ge atoms in amorphous Si(x)Ge(y)H(z) (a-Si(x)Ge(y)H(z)) alloys, thus demonstrating that these experimentally observed effects need not be attributed to specific deposition conditions. In addition, it is predicted that 0 bonds preferentially to Si in a-Si(x)Ge(y)O(z) alloys and that Ge will be more strongly oxidized when present in very dilute concentrations in a-SiO2.
引用
收藏
页码:547 / 556
页数:10
相关论文
共 24 条
[1]   SOLAR-CELLS - PRESENT STATUS AND FUTURE-PROSPECTS [J].
CATALANO, A ;
ARYA, RR ;
FIESELMANN, B ;
GOLDSTEIN, B ;
NEWTON, J ;
WIEDEMAN, S ;
BENNETT, M ;
CARLSON, DE .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1989, 115 (1-3) :14-20
[2]   DEFECTS IN HYDROGENATED AMORPHOUS SILICON-GERMANIUM ALLOYS STUDIED BY PHOTOMODULATION SPECTROSCOPY [J].
CHEN, LG ;
TAUC, J ;
LEE, JK ;
SCHIFF, EA .
PHYSICAL REVIEW B, 1991, 43 (14) :11694-11702
[3]   GAP DENSITY OF STATES IN AMORPHOUS SILICON-GERMANIUM ALLOY - INFLUENCE ON PHOTOTHERMAL DEFLECTION SPECTROSCOPY AND STEADY-STATE CONDUCTIVITY MEASUREMENTS [J].
DELLASALA, D ;
REITA, C ;
CONTE, G ;
GALLUZZI, F ;
GRILLO, G .
JOURNAL OF APPLIED PHYSICS, 1990, 67 (02) :814-825
[4]   ATOMIC BONDING IN AMORPHOUS HYDROGENATED SILICON-CARBIDE ALLOYS - A STATISTICAL THERMODYNAMIC APPROACH [J].
EFSTATHIADIS, H ;
YIN, Z ;
SMITH, FW .
PHYSICAL REVIEW B, 1992, 46 (20) :13119-13130
[5]  
EUGENE J, 1991, APPL PHYS LETT, V59, P78, DOI 10.1063/1.105528
[6]   FORMATION OF EPITAXIAL LAYERS OF GE ON SI SUBSTRATES BY GE IMPLANTATION AND OXIDATION [J].
FATHY, D ;
HOLLAND, OW ;
WHITE, CW .
APPLIED PHYSICS LETTERS, 1987, 51 (17) :1337-1339
[7]   GROWTH OF GE MICROCRYSTALS IN SIO2 THIN-FILM MATRICES - A RAMAN AND ELECTRON-MICROSCOPIC STUDY [J].
FUJII, M ;
HAYASHI, S ;
YAMAMOTO, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1991, 30 (04) :687-694
[8]   INFRARED-SPECTROSCOPY DURING HYDROGEN EFFUSION OF A-SI-H, A-SIGE-H AND A-GE-H [J].
HEINTZE, M ;
EBERHARDT, K ;
TRESS, O ;
BAUER, GH .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1991, 137 :49-52
[9]   OXIDATION STUDIES OF SIGE [J].
LEGOUES, FK ;
ROSENBERG, R ;
NGUYEN, T ;
HIMPSEL, F ;
MEYERSON, BS .
JOURNAL OF APPLIED PHYSICS, 1989, 65 (04) :1724-1728
[10]   FORMATION OF STOICHIOMETRIC SIGE OXIDE BY ELECTRON-CYCLOTRON RESONANCE PLASMA [J].
LI, PW ;
LIOU, HK ;
YANG, ES ;
IYER, SS ;
SMITH, TP ;
LU, Z .
APPLIED PHYSICS LETTERS, 1992, 60 (26) :3265-3267