DIFFRACTOMETER FOR SYNCHROTRON RADIATION STRUCTURAL STUDIES OF HIGH-TEMPERATURE MELTS

被引：8

作者：

MARUMO, F

MORIKAWA, H

SHIMIZUGAWA, Y

TOKONAMI, M

MIYAKE, M

OHSUMI, K

SASAKI, S

机构：

[1] UNIV TOKYO,INST MINERAL,BUNKYO KU,TOKYO 113,JAPAN

[2] YAMANASHI UNIV,DEPT APPL CHEM,KOFU,YAMANASHI 400,JAPAN

[3] NATL LAB HIGH ENERGY PHYS,PHOTON FACTORY,TSUKUBA,IBARAKI 305,JAPAN

来源：

关键词：

D O I：

10.1063/1.1140735

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：2421 / 2424

页数：4

共 7 条

[1]

ITOH A, 1970, YOGYO-KYOKAI-SHI, V78, P449

[2] X-RAY-DIFFRACTION STUDY OF NA2O-GEO2 MELTS [J].

KAMIYA, K ;

YOKO, T ;

ITOH, Y ;

SAKKA, S .

[3]

Krough-Moe J., 1956, ACTA CRYSTALLOGR, V9, P951

[4]

LEVY HA, 1966, ORNL3960 REP

[5]

MORIKAWA H, 1984, 1983 84 PHOT FACT AC, P11

[6] THE FOURIER TRANSFORM METHOD FOR NORMALIZING INTENSITIES [J].

NORMAN, N .

[7]

SASAKI S, 1984, 1983 1984 PHOT FACT, P10