MULTIPLE-SCATTERING EFFECTS IN THE FOURIER-TRANSFORM DECONVOLUTION PROCEDURE FOR LEED ANALYSIS

A direct Fourier transform deconvolution procedure based on the Southwell relaxation scheme is outlined. The technique is fully tested using low energy electron diffraction (LEED) intensity (I-V) spectra calculated from single scattering theory which shows, in this simple case, that the method is both rapid and accurate and does not suffer from the effects of data truncation. The deliberate introduction of errors in the inner potential and surface Debye temperature is also satisfactorily accounted for. However, the use of I-V spectra calculated from multiple scattering theory produces grossly misleading results. It is concluded that the procedure is not applicable to the evaluation of experimental data. © 1979.