DETERMINATION OF SMALLEST CONCENTRATIONS OF CHEMICAL ELEMENTS IN EMISSION SPECTRUM ANALYSIS WITH PHOTOELECTRIC IRRADIATION MEASUREMENT .2. TRACE DETERMINATION WITH EXIT SLIT SYSTEM FROM PHOTOCONDUCTORS

被引:20
作者
HAISCH, U
LAQUA, K
HAGENAH, WD
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D O I
10.1016/0584-8547(71)80063-0
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
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页码:651 / &
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