CONTRAST ANOMALY OF PLANAR DEFECTS IN SYNCHROTRON WHITE-BEAM TOPOGRAPHY OF FE-DOPED KTA1-XNBXO3

被引：4

作者：

HU, ZW

JIANG, SS

HUANG, XR

FENG, D

ZHAO, JY

JIANG, JH

TING, YL

HAN, Y

WANG, JY

机构：

[1] INST HIGH ENERGY PHYS,BEIJING SYNCHROTRON RADIAT LAB,BEIJING 100039,PEOPLES R CHINA

[2] SHANDONG UNIV,INST CRYSTALS MAT,JINAN 250100,PEOPLES R CHINA

来源：

PHILOSOPHICAL MAGAZINE LETTERS | 1992年 / 66卷 / 05期

关键词：

D O I：

10.1080/09500839208219043

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The contrast anomaly of a set of planar defects in Fe-doped KTa1-xNbxO3 with a Curie point near room temperature has been studied by synchrotron white-beam X-ray topography. A striking wavelength-dependent characteristic of the defect contrast is shown by tuning the synchrotron radiation, and the contrast reversal of the planar defects is displayed in antiparallel reflections. The intense anomaly in contrast is interpreted in terms of anomalous dispersion associated with antiparallel domains.

引用

页码：265 / 269

页数：5

共 18 条

[1]

ANSERMET JP, 1981, J PHYS C SOLID STATE, P4541

[2]

BOATNER LA, 1982, FERROELECTRICS, V27, P247

[3]

BOWEN DK, 1989, APPLICATION SYNCHROT, P91

[4] NATURAL AND ETCHED SURFACES IN PARA-ELECTRIC AND FERROELECTRIC KTA1-XNBXO3 - A STUDY BY SCANNING ELECTRON-MICROSCOPY AND X-RAY TOPOGRAPHY [J].