AN ACCURATE METHOD FOR MEASURING MAGNIFICATION OF AN ELECTRON MICROSCOPE

被引：3

作者：

SKINNER, LM

机构：

[1] Department of Physics, Imperial College, London

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1969年 / 2卷 / 02期

关键词：

D O I：

10.1088/0022-3735/2/2/426

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A method for calibrating the magnification of an electron microscope is described in which a commercially available copper mesh is used as the standard of length.

引用

页码：206 / &