A MULTIPLE CRYSTAL DIFFRACTOMETER FOR GENERATION AND CHARACTERIZATION OF CIRCULARLY POLARIZED X-RAYS AT THE PHOTON FACTORY (INVITED)

被引：26

作者：

ISHIKAWA, T

HIRANO, K

KANZAKI, K

KIKUTA, S

机构：

[1] Department of Applied Physics, Faculty of Engineering, University of Tokyo, Bunkyo-ku, Tokyo 113

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1992年 / 63卷 / 01期

关键词：

D O I：

10.1063/1.1143107

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A multiple crystal diffractometer for polarization optical experiments in x-ray region was constructed at the Photon Factory. Using an x-ray phase retarder of tranmission type in Bragg geometry, tunable-wavelength circular polarized x rays of both helicities were produced with high degree of circular polarization. A method of complete determination of the polarization states in x-ray region was developed with the reverse use of the phase retarder. Polarization switching with a frequency of 0.3 Hz was performed by flipping the phase retarder in a bistable mode. An optical scheme of producing highly intense circular polarizations using the phase retarder and an x-ray undulator is discussed.

引用

页码：1098 / 1103

页数：6

共 14 条

[1] ELLIPTICALLY POLARIZED X-RAYS PRODUCED BY THE SIGMA-COMPONENTS AND PI-COMPONENTS OF LINEARLY POLARIZED X-RAYS IN THE LAUE CASE DYNAMICAL DIFFRACTION [J].