CONTROL OF PHOTON-EMISSION BY SCANNING-TUNNELING-MICROSCOPY IN AIR

被引：22

作者：

SIVEL, V

CORATGER, R

AJUSTRON, F

BEAUVILLAIN, J

机构：

[1] Centre d'Elaboration des Materiaux, D'Itudes Structurales-Laboratoire d'Optique Electronique, 31055 Toulouse, 29 rue J. Marvig

来源：

PHYSICAL REVIEW B | 1994年 / 50卷 / 08期

关键词：

D O I：

10.1103/PhysRevB.50.5628

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Photon emission by means of a scanning-tunneling-microscope junction involves surface-dependent phenomena. Experiments may be performed in ultrahigh vacuum or in air. In this paper, the correlation between the tunnel image and the photonic map of a gold surface in air is presented and the manner in which the emission can be modified to create nonemissive features on an emissive area and emissive features on a nonemissive zone is also reviewed. Emission may be either enhanced or suppressed as required.

引用

页码：5628 / 5634

页数：7

共 33 条

[1] INJECTION LUMINESCENCE FROM CDS(11(2)BAR-0) STUDIED WITH SCANNING TUNNELING MICROSCOPY [J].

BERNDT, R ;

GIMZEWSKI, JK .

PHYSICAL REVIEW B, 1992, 45 (24) :14095-14099

[2] THE ROLE OF PROXIMITY PLASMON MODES ON NOBLE-METAL SURFACES IN SCANNING TUNNELING MICROSCOPY [J].

BERNDT, R ;

GIMZEWSKI, JK .

SURFACE SCIENCE, 1992, 269 :556-559

[3] PHOTON-EMISSION IN SCANNING-TUNNELING-MICROSCOPY - INTERPRETATION OF PHOTON MAPS OF METALLIC SYSTEMS [J].

BERNDT, R ;

GIMZEWSKI, JK .

PHYSICAL REVIEW B, 1993, 48 (07) :4746-4754

[4] INELASTIC TUNNELING EXCITATION OF TIP-INDUCED PLASMON MODES ON NOBLE-METAL SURFACES [J].

BERNDT, R ;

GIMZEWSKI, JK ;

JOHANSSON, P .

PHYSICAL REVIEW LETTERS, 1991, 67 (27) :3796-3799

[5] PHOTON-EMISSION AT MOLECULAR RESOLUTION INDUCED BY A SCANNING TUNNELING MICROSCOPE [J].

BERNDT, R ;

GAISCH, R ;

GIMZEWSKI, JK ;

REIHL, B ;

SCHLITTLER, RR ;

SCHNEIDER, WD ;

TSCHUDY, M .

SCIENCE, 1993, 262 (5138) :1425-1427

[6]

BERNDT R, 1992, THESIS U BASEL

[7] TUNNELING THROUGH A CONTROLLABLE VACUUM GAP [J].

BINNIG, G ;

ROHRER, H ;

GERBER, C ;

WEIBEL, E .

APPLIED PHYSICS LETTERS, 1982, 40 (02) :178-180

[8] A STAGE FOR SUBMICRON DISPLACEMENTS USING ELECTROMAGNETIC COILS AND ITS APPLICATION TO SCANNING TUNNELING MICROSCOPY [J].

CORATGER, R ;

BEAUVILLAIN, J ;

AJUSTRON, F ;

LACAZE, JC ;

TREMOLLIERES, C .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1991, 62 (03) :830-831

[9] CHARACTERIZATION OF GOLD SURFACES FOR USE AS SUBSTRATES IN SCANNING TUNNELING MICROSCOPY STUDIES [J].

EMCH, R ;

NOGAMI, J ;

DOVEK, MM ;

LANG, CA ;

QUATE, CF .

JOURNAL OF APPLIED PHYSICS, 1989, 65 (01) :79-84

[10] PHOTON-EMISSION WITH THE SCANNING TUNNELING MICROSCOPE [J].

GIMZEWSKI, JK ;

REIHL, B ;

COOMBS, JH ;

SCHLITTLER, RR .

ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1988, 72 (04) :497-501

← 1 2 3 4 →