DETERMINATION OF CRYSTAL ORIENTATION FROM INTERSECTIONS OF KIKUCHI LINES

[1] AMELINCKX S, 1959, ADV SOLID STATE PHYS, V8, P327

[2] [Anonymous], 2012, CRYSTAL DEFECTS CRYS

[3] HALBIG H, 1968, MIKROCHIM ACTA S3, P201

[4] HALBIG H, 1969, 5TH P INT C XRAY OPT, P388

[5] PRECISE ORIENTATION DETERMINATION BY ELECTRON DIFFRACTION SINGLE-POLE KIKUCHI PATTERNS [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1971, 5 (01): : 137 - &

[6] Heimendahl M., 1964, J APPL PHYS, V35, P3614

[7] HIRSCH PB, 1965, ELECTRON MICROSCOPY

[8] Kikuchi S., 1928, P IMP ACAD JAPAN, V4, P271

[9] ELECTRON MICROSCOPY AND DIFFRACTION OF THIN FILMS - INTERPRETATION AND CORRELATION OF IMAGES AND DIFFRACTION PATTERNS [J]. PHYSICA STATUS SOLIDI, 1964, 5 (03): : 527 - 549

[10] Sources of Error in Accurate Orientations Determined by Electron Diffraction [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1970, 3 (02): : 375 - 381

[1] AMELINCKX S, 1959, ADV SOLID STATE PHYS, V8, P327

[2] [Anonymous], 2012, CRYSTAL DEFECTS CRYS

[3] HALBIG H, 1968, MIKROCHIM ACTA S3, P201

[4] HALBIG H, 1969, 5TH P INT C XRAY OPT, P388

[5] PRECISE ORIENTATION DETERMINATION BY ELECTRON DIFFRACTION SINGLE-POLE KIKUCHI PATTERNS [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1971, 5 (01): : 137 - &

[6] Heimendahl M., 1964, J APPL PHYS, V35, P3614

[7] HIRSCH PB, 1965, ELECTRON MICROSCOPY

[8] Kikuchi S., 1928, P IMP ACAD JAPAN, V4, P271

[9] ELECTRON MICROSCOPY AND DIFFRACTION OF THIN FILMS - INTERPRETATION AND CORRELATION OF IMAGES AND DIFFRACTION PATTERNS [J]. PHYSICA STATUS SOLIDI, 1964, 5 (03): : 527 - 549

[10] Sources of Error in Accurate Orientations Determined by Electron Diffraction [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1970, 3 (02): : 375 - 381