EFFECT OF DISLOCATIONS ON X-RAY DIFFRACTION PROPERTIES OF COPPER

被引：13

作者：

BACHMANN, KJ

BALDWIN, TO

YOUNG, FW

机构：

[1] Oak Ridge Natl Lab, Solid State Div, D-14195 Oak Ridge, TN USA

[2] Max Planck Gesell, Fritz Haber Inst, Berlin, GERMANY

来源：

JOURNAL OF APPLIED PHYSICS | 1970年 / 41卷 / 12期

关键词：

D O I：

10.1063/1.1658541

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：4783 / +

页数：1

共 22 条

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[3] DYNAMICAL DIFFRACTION OF X RAYS BY PERFECT CRYSTALS [J].

BATTERMAN, BW ;

COLE, H .

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[4] X-RAY INVESTIGATION OF PERFECTION OF SILICON [J].

CARRUTHERS, JR ;

ASHNER, JD ;

HOFFMAN, RB .

JOURNAL OF APPLIED PHYSICS, 1963, 34 (11) :3389-&

[5]

CRUMP JC, 1968, PHILOS MAG, V17, P381

[6]

EICHHORN F, 1969, 8 INT C CRYST STON B

[7] THE ESTIMATION OF DISLOCATION DENSITIES IN METALS FROM X-RAY DATA [J].

GAY, P ;

HIRSCH, PB ;

KELLY, A .

ACTA METALLURGICA, 1953, 1 (03) :315-319

[8] INTENSITY OF X-RAY REFLEXION FROM PERFECT AND MOSAIC ABSORBING CRYSTALS [J].

HIRSCH, PB ;

RAMACHANDRAN, GN .

ACTA CRYSTALLOGRAPHICA, 1950, 3 (03) :187-194

[9]

JAMES FW, 1950, OPTICAL PRINCIPLES D, P52

[10]

KAUFMAN L, 1959, T AM I MIN MET ENG, V215, P273

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