SURFACE RECONSTRUCTIONS IN THE AG/SI(111) SYSTEM

被引：148

作者：

WAN, KJ

LIN, XF

NOGAMI, J

机构：

[1] UNIV WISCONSIN,DEPT PHYS,MILWAUKEE,WI 53201

[2] UNIV WISCONSIN,SURFACE STUDIES LAB,MILWAUKEE,WI 53201

来源：

PHYSICAL REVIEW B | 1993年 / 47卷 / 20期

关键词：

D O I：

10.1103/PhysRevB.47.13700

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The behavior of silver on the Si(111) surface has been studied as a function of overlayer coverage and deposition conditions using scanning tunneling microscopy (STM) and low-energy electron diffraction. We examine how the different roles of Ag coverage and thermal annealing history determine surface ordering phenomena and atomic structure in this system. A growth phase diagram based on STM observations is presented. This diagram contains the well-known square-root 3 X square-root 3 and 3 X 1 reconstructions, as well as a phase characterized by 5 X 2 periodicity. Possible surface atomic arrangements for each phase are discussed based on the STM observations.

引用

收藏

页码：13700 / 13712

页数：13

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