SOME CRITERIA FOR RELIABILITY GROWTH

被引：7

作者：

BAXTER, LA

机构：

来源：

MICROELECTRONICS AND RELIABILITY | 1988年 / 28卷 / 05期

关键词：

D O I：

10.1016/0026-2714(88)90010-8

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：743 / 750

页数：8

共 9 条

[1]

BARLOW RE, 1975, STATISTICAL THEORY R

[2] RELIABILITY APPLICATIONS OF THE RELEVATION TRANSFORM [J].

BAXTER, LA .

BROWN, M .

BROWN, M .

[5] A GENERAL FRAMEWORK FOR LEARNING-CURVE RELIABILITY GROWTH-MODELS [J].

JEWELL, WS .

[6] A UNIFICATION OF SOME SOFTWARE-RELIABILITY MODELS [J].

LANGBERG, N ;

SINGPURWALLA, ND .

SIAM JOURNAL ON SCIENTIFIC AND STATISTICAL COMPUTING, 1985, 6 (03) :781-790

[7]

Ross S. M., 1983, STOCHASTIC PROCESSES

[8]

Royden H.L., 1968, REAL ANAL, V2nd

[9] CLOSURE-PROPERTIES OF THE RELEVATION TRANSFORM [J].

SHANTHIKUMAR, JG ;

BAXTER, LA .