HIGH-RESOLUTION THERMAL MAPPING OF MICROCIRCUITS USING NEMATIC LIQUID-CRYSTALS

被引：19

作者：

ASZODI, G

SZABON, J

JANOSSY, I

SZEKELY, V

机构：

来源：

关键词：

D O I：

10.1016/0038-1101(81)90181-7

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1127 / &

共 10 条

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GIANNINI, F
MALTESE, P
SORRENTINO, R
[J]. APPLIED OPTICS, 1979, 18 (17): : 3048 - 3052
[4] HERMAN MA, 1976, AUT P INT SCH SEM OP
[5] MEIER G, 1975, APPLICATIONS LIQUID
[6] SIKLOS L, 1981, ADV LIQ CRYS RES APP
[7] A TECHNIQUE FOR THE MEASUREMENT OF HOT SPOTS AND ISOTHERM PROFILES AT THE SURFACES OF THE ELEMENTS OF HYBRID MICROCIRCUITS
SINNADURAI, FN
[J]. ELECTROCOMPONENT SCIENCE AND TECHNOLOGY, 1980, 6 (3-4): : 177 - 183
[8] SURFACE-TEMPERATURE LIMIT DETECTOR USING NEMATIC LIQUID-CRYSTALS WITH AN APPLICATION TO MICROCIRCUITS
STEPHENS, CE
SINNADURAI, FN
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1974, 7 (08): : 641 - 643
[9] SZABON J, 1978, KFKI197822 PREPR
[10] SZEKELY V, 1980, 5TH HUNG C EL MEAS E