The determination of x-ray line shapes by a double crystal spectrometer

被引：26

作者：

Smith, LP ^{[1
]}

机构：

[1] Cornell Univ, Ithaca, NY USA

来源：

PHYSICAL REVIEW | 1934年 / 46卷 / 05期

关键词：

D O I：

10.1103/PhysRev.46.343

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：0343 / 0351

页数：9

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