DOPED SURFACE 2-PHASE CCD

被引:17
作者
KRAMBECK, RH
WALDEN, RH
PICKAR, KA
机构
来源
BELL SYSTEM TECHNICAL JOURNAL | 1972年 / 51卷 / 08期
关键词
D O I
10.1002/j.1538-7305.1972.tb02688.x
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1849 / +
页数:1
相关论文
共 9 条
[1]   SURFACE STATES AT STEAM-GROWN SILICON-SILICON DIOXIDE INTERFACES [J].
BERGLUND, CN .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1966, ED13 (10) :701-+
[2]   CHARGE COUPLED SEMICONDUCTOR DEVICES [J].
BOYLE, WS ;
SMITH, GE .
BELL SYSTEM TECHNICAL JOURNAL, 1970, 49 (04) :587-+
[3]  
CASTANGE R, 1968, CR HEBD ACAD SCI, V17, P866
[4]  
ENGELER WE, 1971 IEEE SOL STAT C
[5]   ZERO LOSS TRANSFER ACROSS GAPS IN A CCD [J].
KRAMBECK, RH .
BELL SYSTEM TECHNICAL JOURNAL, 1971, 50 (10) :3169-+
[6]  
KUHN M, 1969, OCT INT EL DEV M
[7]   NONLINEAR DIFFUSION ANALYSIS OF CHARGE-COUPLED-DEVICE TRANSFER [J].
STRAIN, RJ ;
SCHRYER, NL .
BELL SYSTEM TECHNICAL JOURNAL, 1971, 50 (06) :1721-+
[8]  
STRAIN RJ, 1970, INT ELECTRON DEVICES
[9]   CHARGE COUPLED 8-BIT SHIFT REGISTER [J].
TOMPSETT, MF ;
AMELIO, GF ;
SMITH, GE .
APPLIED PHYSICS LETTERS, 1970, 17 (03) :111-&