SURFACE ROUGHNESS STUDIES BY OPTICAL PROCESSING METHODS

被引：3

作者：

ANDERSON, WL

机构：

[1] Southwest Research Inst., San Antonio, Tex.

来源：

PROCEEDINGS OF THE IEEE | 1969年 / 57卷 / 01期

关键词：

D O I：

10.1109/PROC.1969.6887

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Recovery of power spectral density information on surface roughness by use of optical processing methods is discussed and a technique for accomplishing this with relative ease is pointed out. Copyright © 1969 by The Institute of Electrical and Electronics Engineers, Inc.

引用

页码：95 / &