RELIABILITY FACTORS FOR LEED CALCULATIONS

[1] Heinz T., 1995, LOW ENERGY ELECTRON, V14, P1421

[2] LEED CRYSTALLOGRAPHY [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1978, 11 (21): : 4271 - 4306

[3] DETERMINATION OF C(2X2) STRUCTURE OF SULFUR ON FE[001] BY LOW-ENERGY ELECTRON-DIFFRACTION [J]. SURFACE SCIENCE, 1977, 66 (01) : 25 - 37

[4] MARCUS PM, 1976, ADV CHARACTERISATION

[5] TONG SY, 1977, ELECTRON DIFFRACTION

[6] SURFACE-STRUCTURE REFINEMENTS OF 2H-MOS2,2H-NBSE2 AND W(100)P(2X1)-O VIA NEW RELIABILITY FACTORS FOR SURFACE CRYSTALLOGRAPHY [J]. SURFACE SCIENCE, 1977, 64 (01) : 85 - 95

[7] ZANNAZZI E, 1977, SURF SCI, V62, P61

[1] Heinz T., 1995, LOW ENERGY ELECTRON, V14, P1421

[2] LEED CRYSTALLOGRAPHY [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1978, 11 (21): : 4271 - 4306

[3] DETERMINATION OF C(2X2) STRUCTURE OF SULFUR ON FE[001] BY LOW-ENERGY ELECTRON-DIFFRACTION [J]. SURFACE SCIENCE, 1977, 66 (01) : 25 - 37

[4] MARCUS PM, 1976, ADV CHARACTERISATION

[5] TONG SY, 1977, ELECTRON DIFFRACTION

[6] SURFACE-STRUCTURE REFINEMENTS OF 2H-MOS2,2H-NBSE2 AND W(100)P(2X1)-O VIA NEW RELIABILITY FACTORS FOR SURFACE CRYSTALLOGRAPHY [J]. SURFACE SCIENCE, 1977, 64 (01) : 85 - 95

[7] ZANNAZZI E, 1977, SURF SCI, V62, P61