The use of the refraction of x-rays for the determination of the specific charge of the electron

被引：7

作者：

Stauss, HE ^{[1
]}

机构：

[1] Univ Chicago, Ryerson Phys Lab, Chicago, IL USA

来源：

PHYSICAL REVIEW | 1930年 / 36卷 / 07期

关键词：

D O I：

10.1103/PhysRev.36.1101

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1101 / 1108

页数：8

共 6 条

[1]

BACKLIN E, 1928, THESIS UPSALA

[2] Wave-length of the K lines of copper using ruled gratings [J].

Bearden, JA .

[3]

BIRGE RT, 1929, PHYS REV S, V1, P43

[4] Molybdenum L-series wave-lengths by ruled gratings [J].

Cory, JM .

PHYSICAL REVIEW, 1930, 35 (12) :1456-1462

[5]

LARSON A, 1925, PHYS REV, V25, P245

[6] The prism with an index of refraction less than unity [J].

Stauss, HE .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA AND REVIEW OF SCIENTIFIC INSTRUMENTS, 1929, 19 (04) :167-174