AN IMPROVED DEVICE FOR X-RAY DIFFRACTION STUDIES AT LOW TEMPERATURES

被引：86

作者：

POST, B

SCHWARTZ, RS

FANKUCHEN, I

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1951年 / 22卷 / 03期

关键词：

D O I：

10.1063/1.1745893

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：218 / 219

页数：2

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[1] FURTHER TECHNIQUES IN SINGLE-CRYSTAL X-RAY DIFFRACTION STUDIES AT LOW TEMPERATURES
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LIPSCOMB, WN
REED, TB
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1950, 21 (04) : 396 - 397
[2] A LOW TEMPERATURE SINGLE CRYSTAL X-RAY DIFFRACTION TECHNIQUE
KAUFMAN, HS
FANKUCHEN, I
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1949, 20 (10) : 733 - 734
[3] POLARIZING ATTACHMENT FOR THE MICROSCOPE OF A SINGLE CRYSTAL X-RAY GONIOMETER
PERUTZ, MF
[J]. JOURNAL OF SCIENTIFIC INSTRUMENTS AND OF PHYSICS IN INDUSTRY, 1949, 26 (04): : 127 - 128