ORIGIN OF DISCLOCATIONS OBSERVED BY X-RAY TOPOGRAPHY DURING MICRODEFORMATION TESTS ON FCC METALS

被引：10

作者：

KELLERHALS, J

MINARI, F

PICHAUD, B

机构：

[1] Sciences et Techniques Universitè, Marseille Cedex, Aix-Marseille III

来源：

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1979年 / 39卷 / 03期

关键词：

D O I：

10.1080/01418617908236905

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

All the topographic observations of dislocations under stress during tensile tests lead to a discrepancy between the activation stress and the length of the sources. The origin of these dislocations is therefore uncertain. We know that uncontrolled bending components could be responsible for their activation. © 1979 Taylor & Francis Group, LLC.

引用

页码：341 / 353

页数：13

共 16 条

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RUSTAD, O
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