CRYSTALLOGRAPHIC SHEAR PHASES IN SYSTEM TIXWO3

被引：26

作者：

EKSTROM, T

TILLEY, RJD

机构：

[1] UNIV STOCKHOLM,DEPT INORG CHEM,ARRHENIUS LAB,S-10405 STOCKHOLM,SWEDEN

[2] UNIV BRADFORD,SCH MAT SCI,BRADFORD BD7 1DP,YORKSHIRE,ENGLAND

来源：

MATERIALS RESEARCH BULLETIN | 1974年 / 9卷 / 05期

关键词：

D O I：

10.1016/0025-5408(74)90142-1

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：705 / 713

页数：9

共 9 条

[1]

Allpress J. G., 1970, Crystal Lattice Defects, V1, P331

[2] CRYSTALLOGRAPHIC SHEAR IN WO3.XNB2O5 (X=0.03-0.09) [J].

ALLPRESS, JG .

JOURNAL OF SOLID STATE CHEMISTRY, 1972, 4 (02) :173-&

[3] DIRECT OBSERVATION OF STRUCTURE OF REAL CRYSTALS BY LATTICE IMAGING [J].

ALLPRESS, JG ;

SANDERS, JV .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1973, 6 (JUN1) :165-190

[4] EXAMINATION OF SUBSTOICHIOMETRIC WO3-X CRYSTALS BY ELECTRON MICROSCOPY [J].

ALLPRESS, JG ;

TILLEY, RJD ;

SEINKO, MJ .

JOURNAL OF SOLID STATE CHEMISTRY, 1971, 3 (03) :440-&

[5] CS FAMILIES DERIVED FROM REO3 STRUCTURE TYPE - ELECTRON-MICROSCOPE STUDY OF REDUCED WO3 AND RELATED PSEUDOBINARY SYSTEMS [J].

BURSILL, LA ;

HYDE, BG .

JOURNAL OF SOLID STATE CHEMISTRY, 1972, 4 (03) :430-&

[6] DIRECT OBSERVATION OF LATTICE DEFECTS IN H-NB2O5 BY HIGH-RESOLUTION MICROSCOPY [J].

IIJIMA, S .

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1973, 29 (JAN1) :18-+

[7]

SUNDBERG MR, IN PRESS

[8] FORMATION OF SHEAR STRUCTURES IN SUB-STOICHIOMETRIC TUNGSTEN TRIOXIDE [J].

TILLEY, RJD .

MATERIALS RESEARCH BULLETIN, 1970, 5 (09) :813-&

[9]

TILLEY RJD, UNPUBLISHED RESULTS

← 1 →