CAVITY PERTURBATION TECHNIQUES FOR MEASUREMENT OF MICROWAVE CONDUCTIVITY AND DIELECTRIC-CONSTANT OF A BULK SEMICONDUCTOR MATERIAL

被引：22

作者：

ELDUMIATI, II

HADDAD, GI

机构：

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1972年 / MT20卷 / 02期

关键词：

D O I：

10.1109/TMTT.1972.1127695

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：126 / +

页数：1

共 12 条

[1]

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[2]

CASIMIR HRG, 1951, PHILLIPS RES REPTS, V6

[3] ELECTRODELESS DETERMINATION OF SEMICONDUCTOR CONDUCTIVITY FROM TE01 DEGREES-MODE REFLECTIVITY [J].

CHAMPLIN, KS ;

HOLM, JD ;

GLOVER, GH .

JOURNAL OF APPLIED PHYSICS, 1967, 38 (01) :96-+

[4] GAP EFFECT IN MEASUREMENT OF LARGE PERMITTIVITIES [J].

CHAMPLIN, KS ;

GLOVER, GH .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1966, MT14 (08) :397-&

[5]

DALTROY FA, 1954, PHYS REV, V94, P1415

[6] TECHNIQUES FOR MEASUREMENT OF COMPLEX MICROWAVE CONDUCTIVITY AND ASSOCIATED ERRORS [J].

DATTA, AN ;

NAG, BR .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1970, MT18 (03) :162-&

[7] EXTENSION OF ONSAGERS THEORY OF RECIPROCAL RELATIONS .1. [J].

DEGROOT, SR ;

MAZUR, P .

PHYSICAL REVIEW, 1954, 94 (02) :218-223

[8]

ELDUMIATI II, 1970, 118 U MICH EL PHYS L

[9]

Ginzton EL., 1957, MICROWAVE MEASUREMEN

[10]

HOLM JD, 1967, THESIS U MINNESOTA

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