A DIAGNOSTIC EXPERT SYSTEM PROTOTYPE FOR CIM

This paper describes the Diagnostic System Prototype (DSP), consisting of a deep knowledge base and several shallow knowledge bases, and shows how it works. Based on the theory of hierarchical systems and hybrid diagnostic reasoning, the DSP tries to find a cause(s) for an observed symptom in CIM (Computer-Integrated Manufacturing), using the concept of entropy. The entropy is calculated using test costs and degrees of belief for each rule in the shallow knowledge bases. The DSP is expected to be applicable to different domains other than just the manufacturing environment.