APPLICATION OF T-MATRIX PERTURBATION METHOD TO ANALYSIS OF LOW-ENERGY-ELECTRON-DIFFRACTION SPECTRA FOR ALUMINUM

被引:21
作者
TONG, SY
RHODIN, TN
TAIT, RH
机构
[1] CORNELL UNIV,SCH APPL & ENGN PHYS,ITHACA,NY 14850
[2] CORNELL UNIV,DEPT PHYS,ITHACA,NY 14850
来源
PHYSICAL REVIEW B | 1973年 / 8卷 / 02期
关键词
D O I
10.1103/PhysRevB.8.430
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:430 / 440
页数:11
相关论文
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