CHARACTERIZATION OF DIAMOND SINGLE-CRYSTALS BY MEANS OF DOUBLE-CRYSTAL X-RAY-DIFFRACTION AND POSITRON-ANNIHILATION

被引：7

作者：

FUJII, S ^{[1
]}

NISHIBAYASHI, Y ^{[1
]}

SHIKATA, S ^{[1
]}

UEDONO, A ^{[1
]}

TANIGAWA, S ^{[1
]}

机构：

[1] UNIV TSUKUBA,INST MAT SCI,TSUKUBA,IBARAKI 305,JAPAN

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1995年 / 61卷 / 03期

关键词：

61.72.Ji;

D O I：

10.1007/BF01538199

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The crystallinity of synthesized and natural crystals of diamond was characterized by double-crystal X-ray diffraction and positron annihilation. The two-dimensional angular correlation of annihilation radiation and positron lifetime measurements revealed that in natural crystals positroniums are formed in a high fraction. The synthesized crystal Ib showed both an extremely small width for the diffraction and a positron lifetime spectrum with a single component of the lifetime of 115 ps. In contrast, the natural diamonds contain a long-lived component of lifetime longer than 2 ns. The diffusion length of positrons was also measured by a variable-energy positron beam. In the synthesized crystal IIa, a diffusion length of about 100.8 nm was observed.

引用

页码：331 / 333

页数：3

共 8 条

[1]

BOGDANOV AV, 1982, SOV PHYS SEMICOND+, V16, P720

[2] DEFECT CHARACTERIZATION IN DIAMONDS BY MEANS OF POSITRON-ANNIHILATION [J].