SURFACE CORE-LEVEL SHIFTS OF THE SI(111) SQUARE-ROOT-3SQUARE-ROOT-3-GA SURFACE

[1] PHOTOEMISSION FROM SURFACE-ATOM CORE LEVELS, SURFACE DENSITIES OF STATES, AND METAL-ATOM CLUSTERS - A UNIFIED PICTURE [J]. PHYSICAL REVIEW B, 1983, 27 (06): : 3176 - 3200

[2] STRUCTURE OF SN/GE(111) FROM LOW-ENERGY ELECTRON-DIFFRACTION AND PHOTOEMISSION-STUDIES [J]. PHYSICAL REVIEW B, 1985, 31 (04): : 2330 - 2337

[3] STUDY OF THE SI(111) SQUARE-ROOT-3XSQUARE-ROOT-3-GA SURFACE BY X-RAY PHOTOELECTRON AND AUGER-ELECTRON DIFFRACTION [J]. SURFACE SCIENCE, 1986, 175 (03) : L794 - L800

[4] ANGLE-RESOLVED ULTRAVIOLET-PHOTOELECTRON-SPECTROSCOPY STUDY OF THE SI(111) SQUARE-ROOT-3 X SQUARE-ROOT-3-AL SURFACE [J]. PHYSICAL REVIEW B, 1985, 32 (04) : 2714 - 2716

[5] COMPARATIVE-STUDY OF THE SI(111)-SQUARE-ROOT-3X-SQUARE-ROOT-3-GA AND SI(111)-SQUARE-ROOT-3X-SQUARE-ROOT-3-AL SURFACES BY ANGLE-RESOLVED ULTRAVIOLET PHOTOELECTRON-SPECTROSCOPY [J]. SOLID STATE COMMUNICATIONS, 1985, 56 (08) : 681 - 685

[6] ANGLE-RESOLVED PHOTOELECTRON-SPECTROSCOPY STUDY OF THE SI(111) SQUARE-ROOT-3X-SQUARE-ROOT-3-SN SURFACE - COMPARISON WITH SI(111) SQUARE-ROOT-3X-SQUARE-ROOT-3-AL, SQUARE-ROOT-3X-SQUARE-ROOT-3-GA, AND SQUARE-ROOT-3XSQUARE-ROOT-3-IN SURFACES [J]. PHYSICAL REVIEW B, 1986, 34 (04): : 3011 - 3014

[7] PHOTOEMISSION-STUDY OF SI(111)-GE(5X5) SURFACES [J]. PHYSICAL REVIEW B, 1986, 33 (10): : 6983 - 6989

[8] A NEW CONSTANT DEVIATION MONOCHROMATOR FOR ANGLE RESOLVED PHOTOEMISSION SPECTROSCOPY [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1985, 24 (03): : 293 - 298

[9] NAGAYOSHI H, 1985, SOLID STATE SCI, V59, P167

[10] Nakagawa T., 1980, Recent Developments in Statistical Inference and Data Analysis. Proceedings of the International Conference in Statistics, P221

[1] PHOTOEMISSION FROM SURFACE-ATOM CORE LEVELS, SURFACE DENSITIES OF STATES, AND METAL-ATOM CLUSTERS - A UNIFIED PICTURE [J]. PHYSICAL REVIEW B, 1983, 27 (06): : 3176 - 3200

[2] STRUCTURE OF SN/GE(111) FROM LOW-ENERGY ELECTRON-DIFFRACTION AND PHOTOEMISSION-STUDIES [J]. PHYSICAL REVIEW B, 1985, 31 (04): : 2330 - 2337

[3] STUDY OF THE SI(111) SQUARE-ROOT-3XSQUARE-ROOT-3-GA SURFACE BY X-RAY PHOTOELECTRON AND AUGER-ELECTRON DIFFRACTION [J]. SURFACE SCIENCE, 1986, 175 (03) : L794 - L800

[4] ANGLE-RESOLVED ULTRAVIOLET-PHOTOELECTRON-SPECTROSCOPY STUDY OF THE SI(111) SQUARE-ROOT-3 X SQUARE-ROOT-3-AL SURFACE [J]. PHYSICAL REVIEW B, 1985, 32 (04) : 2714 - 2716

[5] COMPARATIVE-STUDY OF THE SI(111)-SQUARE-ROOT-3X-SQUARE-ROOT-3-GA AND SI(111)-SQUARE-ROOT-3X-SQUARE-ROOT-3-AL SURFACES BY ANGLE-RESOLVED ULTRAVIOLET PHOTOELECTRON-SPECTROSCOPY [J]. SOLID STATE COMMUNICATIONS, 1985, 56 (08) : 681 - 685

[6] ANGLE-RESOLVED PHOTOELECTRON-SPECTROSCOPY STUDY OF THE SI(111) SQUARE-ROOT-3X-SQUARE-ROOT-3-SN SURFACE - COMPARISON WITH SI(111) SQUARE-ROOT-3X-SQUARE-ROOT-3-AL, SQUARE-ROOT-3X-SQUARE-ROOT-3-GA, AND SQUARE-ROOT-3XSQUARE-ROOT-3-IN SURFACES [J]. PHYSICAL REVIEW B, 1986, 34 (04): : 3011 - 3014

[7] PHOTOEMISSION-STUDY OF SI(111)-GE(5X5) SURFACES [J]. PHYSICAL REVIEW B, 1986, 33 (10): : 6983 - 6989

[8] A NEW CONSTANT DEVIATION MONOCHROMATOR FOR ANGLE RESOLVED PHOTOEMISSION SPECTROSCOPY [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1985, 24 (03): : 293 - 298

[9] NAGAYOSHI H, 1985, SOLID STATE SCI, V59, P167

[10] Nakagawa T., 1980, Recent Developments in Statistical Inference and Data Analysis. Proceedings of the International Conference in Statistics, P221