DETECTION OF FOREIGN ATOM SITES BY THEIR X-RAY FLUORESCENCE SCATTERING

被引：196

作者：

BATTERMAN, BW

机构：

[1] Department of Materials Science and Engineering, Cornell University, Ithaca

来源：

PHYSICAL REVIEW LETTERS | 1969年 / 22卷 / 14期

关键词：

D O I：

10.1103/PhysRevLett.22.703

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The position of a solute atom in a lattice can be detected by the nature of its x-ray fluorescence excitation during a diffraction process. © 1969 The American Physical Society.

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页码：703 / +

页数：1

相关论文

共 3 条

[1] DYNAMICAL DIFFRACTION OF X RAYS BY PERFECT CRYSTALS [J].

BATTERMAN, BW ;

COLE, H .

REVIEWS OF MODERN PHYSICS, 1964, 36 (03) :681-&

[2] EFFECT OF DYNAMICAL DIFFRACTION IN X-RAY FLUORESCENCE SCATTERING [J].

BATTERMAN, BW .

PHYSICAL REVIEW A-GENERAL PHYSICS, 1964, 133 (3A) :A759-&

[3]

CHADDERTON LT, 1968, THIN FILMS, V1, P157