ELLIPTIC-POLARIZATION MEASUREMENTS IN THE VACUUM ULTRAVIOLET AND SOFT-X-RAY REGIONS WITH A REFLECTION POLARIMETER

被引：13

作者：

KOIDE, T

SHIDARA, T

YURI, M

KANDAKA, N

FUKUTANI, H

YAMAGUCHI, K

机构：

[1] UNIV TSUKUBA,INST PHYS,TSUKUBA,IBARAKI 305,JAPAN

[2] SCI UNIV TOKYO,DEPT PHYS,TOKYO 162,JAPAN

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1992年 / 63卷 / 01期

关键词：

D O I：

10.1063/1.1143042

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A complete polarization analysis has been successfully achieved for synchrotron radiation beams in the vacuum ultraviolet and soft x-ray regions using a reflection polarimeter. The Stokes parameters, which provide a full description of the polarization state of light, were experimentally determined along with three polarizing quantities of the polarimeter. The present result indicates the possibility of a simultaneous determination of the optical constants of mirror materials through polarization analyses.

引用

页码：1458 / 1461

页数：4

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